Corelis Adds Freescale Hardware Support to Runner-Lite

Update Enables Freescale End Users to Quickly Explore JTAG Test Capabilities.
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Cerritos, CA, June 11, 2012 – Corelis, Inc., the leading supplier of high-performance boundary-scan test and measurement tools, announced today that its free Runner-Lite test executive is now compatible with Freescale USB TAP probes. This added support allows existing Freescale hardware users to execute pre-generated JTAG-based test procedures on select Freescale reference designs. In conjunction with adding Freescale hardware support, Corelis has also distributed a downloadable test procedure for the Freescale QorIQ® P1024 reference design board (RDB). The P1024 RDB represents the first of several Freescale reference designs to be fully supported by Runner-Lite test procedures.

Runner-Lite provides engineers visibility, awareness, and accessibility to board level boundary-scan and functional testing. Each test procedure provides comprehensive fault detection and isolation of boundary-scan chain infrastructure, board interconnect, pull-up/pull-down resistors, and clusters such as memories and UARTs. The software also includes a powerful graphical fault identification subsystem to isolate and visualize the location of PCB faults. The subsystem displays a CAD-based photographic representation of a reference design on the host PC display to facilitate the rapid discovery of the actual location for any failure, even when the fault is hidden underneath devices. “The addition of Freescale hardware support makes direct, convenient JTAG tool access available to a wider audience,” states Harrison Miles, Director of Business Development at Corelis. “Freescale end users can download the software and execute a full suite of boundary-scan and functional tests in a matter of minutes.”

“As our customers drive greater levels of integration into their products, the need for faster clock rates, higher pin counts and finer pitch in our devices is going up, making board development and testing more challenging. Boundary-scan test can provide substantial improvement in board bring-up and testing speeds,” claims Tim Tumilty, Director of Developer Technology at Freescale. “The companywide benefits of being able to move a product more swiftly from development to production are immeasurable. Adding Freescale USB TAP support to Runner-Lite provides the most straight-forward path to introduce early adoption of boundary-scan to our customers.”

Runner-Lite is offered at no charge and can be downloaded from the Corelis website. Visit http://www.corelis.com/runner-lite for more information.

About Corelis Corelis, Inc., a subsidiary of Electronic Warfare Associates, Inc., offers bus analysis tools, embedded test tools, and the industry’s broadest line of JTAG/boundary-scan software and hardware products combining exceptional ease-of-use with advanced technical innovation and unmatched customer service. Since its founding in 1991, Corelis has delivered a diverse range of electronic test equipment solutions for customers across a wide range of industries, including aerospace, defense, medical, manufacturing, networking, and telecommunications. Today, Corelis continues that trend with focus on product ease-of-use and dedication to customer service.

Source: Corelis Adds Freescale Hardware Support to Runner-Lite

Corelis JTAG Tools Extend Manufacturing Test Capability for IEC

Boundary-scan software enables quick, comprehensive test coverage for top manufacturer IEC Electronics.

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Cerritos, CA, June 4, 2012 – Corelis, Inc., the leading supplier of high-performance boundary-scan test and measurement tools, announced the integration of Corelis ScanExpress boundary-scan tools at IEC Electronics in Albuquerque, NM. The ScanExpress system adds non-intrusive JTAG capabilities to IEC Electronics’ impressive test arsenal which already includes automated optical/x-ray inspection (AOI/AXI), in-circuit test (ICT), flying probe, and functional test systems.

Ryan Jones, Senior Technical Marketing Engineer at Corelis, explains the synergy, “As specialists in low volume, high mix manufacturing, engineers at IEC Electronics understand the high setup costs and long development times that traditionally accompany in-circuit testing. Having ScanExpress tools available in-house affords IEC the capability to provide their clients with fast, comprehensive tests at a fraction of the cost of traditional test methods.”

The ScanExpress system includes a rapid test development environment well suited for contract manufacturers with diverse clients. “Boundary-scan by its nature is ideal for testing short manufacturing runs due to fast test development and low setup requirements,” comments Butch Thornburg, Senior Test Engineer at IEC Electronics. “I can develop boundary-scan tests with Corelis tools in a matter of hours. Equivalent ICT tests take days, even weeks to develop.”

The Corelis tools have quickly gained popularity with IEC’s own customers as well. Thornburg explains, “Our boundary-scan projects have been so successful that our defense customers now demand that we perform boundary-scan DFT analyses on all new designs, providing recommendations on how testability can be improved.”

About Corelis 
Corelis, Inc., a subsidiary of Electronic Warfare Associates, Inc., offers bus analysis tools, embedded test tools, and the industry’s broadest line of JTAG/boundary-scan software and hardware products combining exceptional ease-of-use with advanced technical innovation and unmatched customer service. Since its founding in 1991, Corelis has delivered a diverse range of electronic test equipment solutions for customers across a wide range of industries, including aerospace, defense, medical, manufacturing, networking, and telecommunications. Today, Corelis continues that trend with focus on product ease-of-use and dedication to customer service.

Source: Corelis JTAG Tools Extend Manufacturing Test Capability for IEC