Corelis Announces JTAG Embedded Testing for AMD Processors

Complete functional test solution for Athlon, Turion, and Opteron product families.

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Cerritos, CA, October 17, 2011 – Corelis, Inc., the leading supplier of high-performance JTAG test and measurement tools, announced today ScanExpress JET support for AMD embedded processors. Supported AMD processor families include Turion™ II Neo, Athlon™ II Neo, Opteron™ 4100, and Opteron™ Quad-Core (socket Fr5). These processors represent high-performance, low power processing for edge-of-enterprise markets including storage and telecommunications, as well as more traditional embedded markets such as security and medical imaging, military systems, and single-board computing.

ScanExpress JET is the industry’s preferred solution for automated at-speed, non-intrusive functional testing. With ScanExpress JET, JTAG supported CPUs provide the centerpiece for printed circuit board testability, enabling an extension of test coverage typically not available through other methods. The major benefits of using ScanExpress JET for AMD embedded processors include:

• Standardized tests for SDRAM memory, SPI Flash, I2C, and UART
• HyperTransport™ link validation
• Peripheral detection on PCI & PCIe buses
• Fully automatic test development for all supported peripherals
• No boot code requirement for test execution

“Requirements for embedded test techniques continue to grow due to increasing signal speeds and lack of test point access, exceeding the capabilities of traditional bed-of-nails test methods,” cites Ryan Jones, Senior Technical Marketing Engineer at Corelis. “ScanExpress JET now delivers a commercially off-the-shelf embedded test solution specifically targeted towards designers, developers, and production test personnel employing leading-edge AMD technology.”

To receive additional education on the benefits of embedded testing, download the ScanExpress JET whitepaper today at:
http://www.corelis.com/whitepapers/ScanExpressJET_Whitepaper.htm.

About Corelis
Corelis, Inc., a subsidiary of Electronic Warfare Associates, Inc., offers bus analysis tools, embedded test tools, and the industry’s broadest line of JTAG/boundary-scan software and hardware products combining exceptional ease-of-use with advanced technical innovation and unmatched customer service. Since its founding in 1991, Corelis has delivered a diverse range of electronic test equipment solutions for customers across a wide range of industries, including aerospace, defense, medical, manufacturing, networking, and telecommunications. Today, Corelis continues that trend with focus on product ease of use and dedication to customer service.

Source: Corelis Announces JTAG Embedded Testing for AMD Processors

Corelis Offers Advanced JTAG Solution for Teradyne ICTs

New Hardware Platform Features IEEE-1149.6 AC-coupled testing, automatic vector generation, and In-System Programming.
Cerritos, CA, October 4, 2011 – Corelis, Inc., the leading supplier of high-performance JTAG test and measurement tools, announced today the USB-1149.1/CFM, a JTAG hardware platform that seamlessly integrates advanced boundary-scan test patterns into Teradyne in-circuit testers. The USB-1149.1/CFM is designed specifically for use with Teradyne TestStation and GR228x series testers. By utilizing the USB-1149.1/CFM with Corelis’ ScanExpress family of JTAG software products, Teradyne users gain the benefit of:

• High-speed 100 MHz clock rate boundary-scan test support
• JTAG test vector reusability across multiple manufacturing test stations
• Testing of IEEE-1149.6 AC-coupled digital networks
• In-system programming of Flash and CPLD devices including direct SPI and I²C support
• Fully automated boundary-scan test vector generation and execution
• A powerful script engine to customize boundary-scan tests

The USB-1149.1/CFM is a single slot Custom Functional Module (CFM) form factor board that installs directly into one of four slots on a Teradyne Custom Function Board (CFB). Integration is simple and transparent; once installed in the system, the USB-1149.1/CFM JTAG, GPIO, I2C, and SPI signals are available to test fixtures and the tester backplane. Integrated SPI and I2C programming features make the USB-1149.1/CFM an ideal and universal solution for combined boundary-scan, JTAG embedded test, and in-system programming applications.

Harrison Miles, Director of Business Development at Corelis, states, “Requirements for boundary-scan solutions will continue to grow as a result of increasing PCB complexities and technology miniaturization. Adding boundary-scan to in-circuit testers represents a logical step for increasing system capability as high-speed buses and accessibility issues continue to become more prevalent.”

“The USB-1149.1/CFM is designed specifically to ease boundary-scan deployment with existing Teradyne equipment,” adds Ryan Jones, Senior Technical Marketing Engineer at Corelis. “Our solution delivers increased test coverage, faster test times, and lower overall costs, allowing customers to maintain a notable ROI on their Teradyne systems.”

About Corelis
Corelis, Inc., a subsidiary of Electronic Warfare Associates, Inc., offers bus analysis tools, embedded test tools, and the industry’s broadest line of JTAG/boundary-scan software and hardware products combining exceptional ease-of-use with advanced technical innovation and unmatched customer service. Since its founding in 1991, Corelis has delivered a diverse range of electronic test equipment solutions for customers across a wide range of industries, including aerospace, defense, medical, manufacturing, networking, and telecommunications. Today, Corelis continues that trend with focus on product ease of use and dedication to customer service.

Source: Corelis Offers Advanced JTAG Solution for Teradyne ICTs