Corelis to Showcase Latest JTAG/Boundary-scan/I2C Products at IPC International Test and Inspection Technology Conference, November 10-12, 2008

Cerritos, CA, October 28, 2008 – Corelis, Inc. announced today that it will exhibit the latest ScanExpress JTAG/Boundary-scan development and test software as well as Corelis’ ScanExpress JET Functional Emulation Test suite at the upcoming IPC International Test and Inspection Technology Conference in Santa Clara, California, USA.

Show attendees will see ScanExpress JET, which is fully integrated with Corelis’ industry-preferred ScanExpress automated boundary-scan test & development tools for unmatched test coverage on microprocessor-based boards. The Corelis ScanExpress JTAG tool suite offers exceptional flexibility and ease-of-use backed by a powerful support team dedicated to customers’ complete satisfaction and success. With a client list that reads like the international “who’s who” of technology and an acclaimed reputation for technical support, Corelis consistently exceeds client expectations.

Corelis will also display the CAS-1000-I2C high performance I2C bus analyzer, exerciser, debugger and programmer. The most feature-rich I2C bus analyzer on the market today, the CAS-1000-I2C offers unmatched capabilities in a format designed to make tedious measurements simple and effective. Corelis’ famed ease-of-use has been brought to I2C and SMBus bus analysis.

About Corelis
Corelis, Inc., a subsidiary of Electronic Warfare Associates Inc., offers the industry’s broadest line of JTAG/boundary-scan software and hardware products that combine exceptional ease-of-use with advanced technical innovation and unmatched customer service. Soon after its inception in 1991, Corelis’ innovation in JTAG/Boundary-scan Test solutions ultimately resulted in acceptance as a major and preferred vendor of JTAG tools worldwide. Corelis’ development and test tools are used by companies such as Agilent, IBM, Jabil, Rockwell, Hewlett-Packard, Motorola, Nokia, Panasonic, Nortel, Marconi, Ford, Plexus, Broadcom, Ericsson, Flextronics and many others. Today Corelis products can be found globally in every industry developing and/or manufacturing electronic products.

Corelis’ ScanExpress boundary-scan systems are used for interconnect testing as well as JTAG functional emulation test and in-system programming of Flash memories, CPLDs and FPGAs. Systems include a complete range of IEEE-1149.1-compatible boundary-scan testers for PCI, PCI-Express, 10/100 LAN, USB 2.0, cPCI/cPXI and VXI host interfaces.

Source: Corelis to Showcase Latest JTAG/Boundary-scan/I2C Products at IPC International Test and Inspection Technology Conference, November 10-12, 2008

Corelis joins Texas Instruments Developer Network to provide customers with JTAG and I2C solutions for DSPs and MCUs

Corelis offers significant product discounts for TI customers

Cerritos, CA, October 15, 2008 – As a new member of the Texas Instruments (TI) Developer Network, Corelis, Inc. today announced that its high-performance boundary-scan and JTAG functional emulation test tools can be used for TI’s digital signal processors (DSPs) and microcontrollers (MCU). Corelis also provides a line of advanced I2C bus analyzers / exercisers. Together these products support a wide range of TI processor-based development and test activities, making Corelis a natural choice for TI customers.

Corelis also announced that it is offering significant discounts to customers designing/testing TI processor-based products. Customers interested in purchasing ScanExpress JTAG/boundary-scan, ScanExpress JET, and CAS-1000-I2C bus analyzer products are invited to visit http://www.corelis.com/TI-customer.htm for more information. Corelis has equipped select TI engineers with complete boundary-scan / JET software suites for board bring-up, validation and tests to assist customers in their design challenges. MCU focused engineers have received CAS-1000-I2C bus analyzers / exercisers.

“We are very pleased to have Corelis join our network of DSP third party suppliers,” said Lori Vidra, eXpressDSP Development Tools marketing manager at Texas Instruments. “The Corelis ScanExpress boundary-scan test development and execution tools provide our customers with a powerful debug and test capability, covering all of our test requirements including circuit board bring-up, boundary-scan production test and programming, and comprehensive fault diagnosis. Many of our customers are already clients of both Corelis and Corelis’ sister company, Blackhawk, a leading provider of JTAG emulators for our entire line of DSP products. The addition of Corelis’ JTAG Emulation Test (ScanExpress JET) enables functional test of the most complex boards at full operating speed.”

“The Corelis CAS-1000-I2C is a useful tool for anyone developing embedded systems utilizing the I2C bus with our user-friendly, ultra-low power MSP430 microcontrollers,” said Adrian Valenzuela, TI MSP430 Applications Engineer. “The CAS tool’s flexibility has been very valuable in bus debug and compliance checking thanks to its clean, intuitive and information-rich graphical interface. We found the glitch injection feature to be especially convenient for developers who need to get their MCU-based systems up and running quickly. We are very pleased to feature Corelis’ products in our Developer Network catalog.”

“The collaboration between TI and Corelis comes at a most opportune time,” said George B. La Fever, CEO and President of Corelis. “TI is well-known for its dedication to providing its customers with superior products and support. By cooperating with TI and becoming part of the industry’s most qualified group of IC development and support vendors, Corelis will demonstrate to our mutual customers why we are a preferred provider of innovative test products and acclaimed technical support. Additionally, TI will be able to further support their customers effectively with these new tools.”

About the Texas Instruments Developer Network
Corelis is a member of the TI Developer Network, a community of respected, well-established companies offering products and services based on TI analog and digital technology. The Network provides a broad range of end-equipment solutions, embedded software, engineering services and development tools that help customers accelerate innovation to make the world smarter, healthier, safer, greener and more fun.

About Corelis
Corelis, Inc., a subsidiary of Electronic Warfare Associates Inc., offers the industry’s broadest line of JTAG/boundary-scan software and hardware products that combine exceptional ease-of-use with advanced technical innovation and unmatched customer service. Soon after its inception in 1991, Corelis’ innovation in JTAG/Boundary-scan Test solutions ultimately resulted in acceptance as a major and preferred vendor of JTAG tools worldwide. Corelis’ development and test tools are used by companies such as Agilent, IBM, Jabil, Rockwell, Hewlett-Packard, Motorola, Nokia, Panasonic, Nortel, Marconi, Ford, Plexus, Broadcom, Ericsson, Flextronics and many others. Today Corelis products can be found globally in every industry developing and/or manufacturing electronic products.

Corelis’ ScanExpress boundary-scan systems are used for interconnect testing as well as JTAG functional emulation test and in-system programming of Flash memories, CPLDs and FPGAs. Systems include a complete range of IEEE-1149.1-compatible boundary-scan testers for PCI, PCI-Express, 10/100 LAN, USB 2.0, cPCI/cPXI and VXI host interfaces.

Source: Corelis joins Texas Instruments Developer Network to provide customers with JTAG and I2C solutions for DSPs and MCUs

Frost & Sullivan Movers & Shakers Interview with George B. La Fever, President and Chief Executive Officer, Corelis, Inc...

Sujan Sami: Could you brief me about Corelis, Inc. and its activities?
George B. La Fever: Corelis, Inc. was founded in 1991 and introduced our first JTAG boundary-scan products in 1998. We have been leaders and innovators in this international market ever since. Our customers range from start-up companies to those at the top of the Fortune 500. Just over two years ago, Corelis became part of Electronic Warfare Associates, Inc., (EWA) a broad-based technology company providing professional engineering services and specialized products to both U.S. and international customers.

Sujan: Could you highlight on the acceptance and adoption of boundary scan technology in the T&M market?
George: The factors that drove the creation and steady growth of boundary-scan as a viable market beginning in the 1990s have not abated. Test access, time-to-market, and cost issues are more pronounced now than ever. We expect the growing deployment of boundary-scan where reliability, high quality, and strong cost-performance are mandatory. Furthermore, the continuing industry interest in boundary-scan is evident from the number and vitality of related industry standardization projects and initiatives. Corelis is an active participant in a number of industry standards (e.g., 1149.x, 1687) and other initiatives (e.g., INEMI Boundary-Scan Adoption Project).

Sujan: The battle for the choice of platform continues. Frost & Sullivan believes that in future, vendors in the T&M world will have to co-exist, and play it safe and nice. The trend toward hybrid test system isexpected to be the norm in the future. What is your view on this going forward?
George: No one test technology is capable of providing customers with everything they need, and no single company today has the home-grown products for all the major technologies. So we certainly agree that cooperation across vendors with complementary platforms is necessary and desirable. We already do that and we'll continue to do so. For example, we recently announced a partnership with Seica, Inc., to integrate their ICT and flying probe systems with our boundary-scan and functional test products. Seica told us that they have experienced an increased demand for such integration in order to both improve test coverage and decrease overall test cost. These are the sort of benefits that customers get when test industry leaders work together.

Sujan: What interesting market and technology trends do you see that are shaping the future of boundary scan market?
George: Two years ago Corelis was the first company to introduce JTAG Embedded Functional Test (JET) technology to supplement standard boundary-scan capabilities. This technology allows our customers to easily generate at-speed tests which can help them detect signal integrity issues and other problems that traditional boundary-scan cannot. For years we have also worked with complementary partner companies to integrate our tools into other environments for more comprehensive and cost-effective test solutions. Our customers continue to tell us about applications where JTAG-based methodologies can help them, and we are devoting both marketing and R&D resources to pursue them.

Sujan: What are the growth rates do you see for the overall boundary-scan board test market?
George: We anticipate an approximate growth rate of 6%-8% per year into the mid term. Clearly, growth in the larger electronics market greatly influences any corresponding change in the board test market. We think that the boundary-scan's portion of the board test market will remain relatively stable perhaps growing very slightly compared to other board test methods.

Sujan: What efforts are you taking to drive the awareness levels up among end-users?
George: We are participating in the INEMI Boundary-Scan Adoption Project. This is a two-phased approach that will first attempt to measure current levels of boundary-scan awareness and adoption and then to take steps to increase boundary-scan's marketplace acceptance. But we expect this project to take at least a couple of years before bearing fruit, and we are not simply standing by and waiting. We are launching what we call the “Boundary-Scan University” to educate the industry about the value of boundary-scan and teach useful boundary-scan tools and techniques. Our first step in this direction has been to offer our existing training courses at no charge, and we will follow suit as we add more courses to the BSU curriculum.

Sujan: What do you feel are some of the barriers to adoption of boundary scan technology?
George: Boundary-scan needs to fit the development and test economics of board manufacturers. It does in this regard for the higher-end, complex designs where testability is most likely paramount. In contrast to ICT, where a bed-of-nails fixture can be designed without much up-front design consideration, boundary-scan requires that designers invest some time, a bit of board real estate, and some level of cost to improve testability. In consumer markets where product cost and time-to-market are the highest consideration, boundary-scan may be a more difficult proposition.

Sujan: How many players compete in this market? Do you see the number of players increasing/decreasing?
George: Today we see three main competitors in our market segment. There are other vendors in the lower market segments that we rarely directly compete. We don't expect this to change much in the near to mid term. The market probably isn't large enough or growing quickly enough to accommodate additional players without significant risk.
Sujan: What have you identified as some of the prime factors for success in this competitive market space?
George: We think the primary success factor is to know, understand and provide timely and innovative solutions to our customer needs. This fundamental approach is no different than any other business. Working closely with customers allows us to continue to adapt to the various board test technologies, applications, and environments that our customers face. We take considerable pride in both our products and our best-in-class customer support. We also clearly recognize the need to work closely with the rest of the industry ecosystem in order to make sure that our tools work well with others and fit properly into the overall market niche. For example, we are now members of Texas Instruments' Third Party programs for both their DSP and Microcontroller devices. By establishing a close relationship with silicon vendors, our products and services can be more in tune with new chip technology and thus better serve our mutual customers.

Sujan: What have been your biggest challenges as the President & CEO of Corelis and how have you re-aligned your strategies to overcome them?
George: The issues facing us now are primarily directed to improvements in infrastructure which will allow us to accommodate growth and change without an appreciable loss in effectiveness, efficiency, or the lengthening of our decision cycle. Our near-term strategies are unchanged. We intend to continue to produce quality boundary-scan products that are based on our customer's stated needs coupled with the best customer support that we can possibly provide.

Sujan: What do you, as President & CEO of Corelis, Inc., want to accomplish in the next couple of years? How would you define success for yourself?
George: Corelis' success will depend on its ability to sustain the existing product line while developing, launching and sustaining other major product lines within the next three to five years. My primary function is to facilitate this goal with: improved infrastructure capabilities and processes; enhanced sales models; disciplined decision making models; and, a full transition to a marketing/sales centric business unit.

Source: Frost & Sullivan Movers & Shakers Interview with George B. La Fever, President and Chief Executive Officer, Corelis, Inc...

Corelis to Showcase Latest JTAG/Boundary-scan/I2C Products at Three Industry Tradeshows in October and November 2008

Corelis will exhibit at the International Test Conference, Oct. 28-30, Santa Clara, CA; IPC International Test and Inspection Conference, Nov. 10-12, Santa Clara, CA; and Electronica, Munich, Germany, Nov. 11-14.

Cerritos, CA, October 8, 2008 – Corelis, Inc. announced today that it will exhibit the latest ScanExpress JTAG/Boundary-scan development and test software as well as Corelis’ ScanExpress JET Functional Emulation Test suite at upcoming tradeshows in Santa Clara, CA, USA and Munich, Germany.

Show attendees will see ScanExpress JET, which is fully integrated with Corelis’ industry-preferred ScanExpress automated boundary-scan test & development tools for unmatched test coverage on microprocessor-based boards.

The Corelis ScanExpress JTAG tool suite offers exceptional flexibility and ease-of-use backed by a powerful support team dedicated to customers’ complete satisfaction and success. With a client list that reads like the international “who’s who” of technology and an acclaimed reputation for technical support, Corelis consistently exceeds client expectations.

Corelis will also display the CAS-1000-I2C high performance I2C bus analyzer, exerciser, debugger and programmer. The most feature-rich I2C bus analyzer on the market today, the CAS-1000-I2C offers unmatched capabilities in a format designed to make tedious measurements simple and effective. Corelis’ famed ease-of-use has been brought to I2C and SMBus bus analysis.

In response to client interest in TI DSPs, Blackhawk, Inc. is exhibiting TI DSP JTAG Emulators jointly with Corelis at ITC and Electronica. Blackhawk is Corelis’ sister company under the corporate umbrella of EWA, Inc.

• International Test Conference, Oct. 28-30, 2008. Santa Clara, CA. Booth # 610.
• International Test and Inspection Conference, Nov. 10-12, 2008. Santa Clara, CA. Tabletop display in exhibits area.

• Electronica, Nov. 11-14, 2008. Munich, Germany. Corelis Distributor- A.R. Bayer DSP Systeme GmbH Area A6- Booth # 611

About Corelis
Corelis, Inc., a subsidiary of Electronic Warfare Associates Inc., offers the industry’s broadest line of JTAG/boundary-scan software and hardware products that combine exceptional ease-of-use with advanced technical innovation and unmatched customer service. Soon after its inception in 1991, Corelis’ innovation in JTAG/Boundary-scan Test solutions ultimately resulted in acceptance as a major and preferred vendor of JTAG tools worldwide. Corelis’ development and test tools are used by companies such as Agilent, IBM, Jabil, Rockwell, Hewlett-Packard, Motorola, Nokia, Panasonic, Nortel, Marconi, Ford, Plexus, Broadcom, Ericsson, Flextronics and many others. Today Corelis products can be found globally in every industry developing and/or manufacturing electronic products.

Corelis’ ScanExpress boundary-scan systems are used for interconnect testing as well as JTAG functional emulation test and in-system programming of Flash memories, CPLDs and FPGAs. Systems include a complete range of IEEE-1149.1-compatible boundary-scan testers for PCI, PCI-Express, 10/100 LAN, USB 2.0, cPCI/cPXI and VXI host interfaces.

Source: Corelis to Showcase Latest JTAG/Boundary-scan/I2C Products at Three Industry Tradeshows in October and November 2008

Corelis Advances Industry Initiatives to Promote and Improve Circuit Test

JTAG solutions provider
supports IEEE standardization efforts and INEMI program

Cerritos, CA, October 2, 2008 - Corelis announced today that it is providing key support to several industry-wide efforts to advance industry-wide electronic circuit test technology and increase the adoption of boundary-scan methodology. Corelis is helping guide the IEEE 1149.7 and IEEE 1687 standards and is an active participant in International Electronics Manufacturers Initiative (iNEMI) Boundary Scan Adoption Project.

George B. La Fever, President and CEO of Corelis, said, “Our clients, and electronics companies in general, are continually looking for ways to improve testability in response to the rising complexity and component density of their products. At many companies, technology advances can impede test quality and result in higher test costs. Corelis is pleased to be able to apply our unique test expertise and years of experience, toward defining new standards that can alleviate challenging test issues. We also support the iNEMI program to encourage the adoption of boundary-scan as one of today’s most effective ways to reduce test costs and improve product quality.”

IEEE Standard 1149.7
Corelis is actively supporting both the development and the adoption of the IEEE 1149.7 standard, which is expected to be ratified in early 2009. IEEE 1149.7 is a complementary and compatible superset of IEEE 1149.1 (JTAG) that reduces the test interface pin-count from four to only two using the IEEE 1149.7 standard. Despite this impressive economy which is sure to appeal to IC vendors and board designers alike, IEEE 1149.7 also provides powerful extensions, addressing System-on-Chip (SoC) architecture challenges, including scan performance for boards with multi-core devices, power domains, varied device connection topologies and background data transfers. To achieve higher performance for multi-core and other complex IC and packaging applications, the IEEE 1149.7 offers chip-level bypass mechanisms to shorten scan chains, greatly improving the debugging experience.

“IEEE 1149.7 is well on its way to ratification next year and is now being implemented by a number of IC companies,” according to Stephen Lau, emulation technology product manager, Texas Instruments (TI) and a key IEEE 1149.7 proponent. “Corelis, with its years of JTAG experience, has made significant contributions to the emerging standard, and we are very pleased that Corelis will back the standard with its full complement of outstanding products and support when IEEE 1149.7 is ready for deployment.”

Internal JTAG (IEEE P1687)
Corelis is engaged in defining the industry-wide initiative IEEE P1687, commonly referred to as IJTAG (Internal JTAG). IJTAG is a draft standard for access and control of instrumentation embedded within an integrated circuit. The drive for the standard grows from the realization by electronics manufacturers that external design validation; testing and debug technologies are simply running out of gas. More and more chip manufacturers are embedding instruments into silicon as the most practical way of providing the necessary control and observation of both component and system behaviors. Without an accepted standard, however, these instruments require custom, dissimilar management and configuration tools, and devising an integrated solution for board and system-level test becomes increasingly difficult. IJTAG proposes a methodology for access to embedded test and debug features (while not specifying the features themselves) through the IEEE 1149.1 TAP (Test Access Port). The elements of the methodology include a description language for the characteristics of, and communication with, the embedded instruments, and hardware requirements for interfacing to the features.

“IEEE P1687 creates an open ecosystem for deployment of embedded instruments to enhance coverage of IC, board, and system development and test,” according to Kenneth Posse, chairman of the IEEE P1687 Working Group. “Corelis has a broad client base and thus one of its key contributions is to help ensure that IJTAG truly meets both the business and technical needs of the industry at large.”

iNEMI Boundary-Scan Adoption Project
Corelis was already a committed member of the iNEMI Boundary-Scan Adoption Project when it was officially launched earlier this year. The project’s ultimate objective is to broaden the use of boundary-scan across the electronics industry. The initial phase will consist of an industry survey to determine the state of, and obstacles to, adoption. After the survey results have been analyzed and published, the project team will define and initiate actions to address any significant obstacles.

Stated Jim McElroy, iNEMI CEO, “Boundary-scan is clearly a cornerstone technology of today’s circuit board test and, given the inevitable increases in board density, compounded by the universal mandate to keep test expenditures down, we expect boundary-scan will become even more essential in the future. By assuming a key role in our Boundary-Scan Adoption Project, Corelis is fostering cooperation among both complementary and competitive participants, toward iNEMI’s goal of providing industry-standard solutions that will help advance manufacturing technology.”

About Corelis
Corelis, Inc., a subsidiary of Electronic Warfare Associates Inc., offers the industry’s broadest line of JTAG/boundary-scan software and hardware products that combine exceptional ease-of-use with advanced technical innovation and unmatched customer service. Soon after its inception in 1991, Corelis’ innovation in JTAG/Boundary-scan Test solutions ultimately resulted in acceptance as a major and preferred vendor of JTAG tools worldwide. Corelis’ development and test tools are used by companies such as Agilent, IBM, Jabil, Rockwell, Hewlett-Packard, Motorola, Nokia, Panasonic, Nortel, Marconi, Ford, Plexus, Broadcom, Ericsson, Flextronics and many others. Today Corelis products can be found globally in every industry developing and/or manufacturing electronic products.

Corelis’ ScanExpress boundary-scan systems are used for interconnect testing as well as JTAG functional emulation test and in-system programming of Flash memories, CPLDs and FPGAs. Systems include a complete range of IEEE-1149.1-compatible boundary-scan testers for PCI, PCI-Express, 10/100 LAN, USB 2.0, cPCI/cPXI and VXI host interfaces.

Source: Corelis Advances Industry Initiatives to Promote and Improve Circuit Test