Corelis Releases New CD Version 7.7 Boundary-Scan Tool Suite

New Software Release Broadens Structural and Functional Test Capabilities.

Cerritos, CA, May 21, 2012 – Corelis, Inc., the leading supplier of high-performance boundary-scan test and measurement tools, announced today the availability of version 7.7 of its ScanExpress Boundary-Scan Tool Suite. This new version covers a wide range of new features and enhancements including improved constraints handling, support for multi-core devices, and new JTAG Embedded Test support for additional Freescale and Texas Instruments processors.

Software improvements include:

• Separate global and local constraint entry within the ScanExpress TPG preparation GUI.
• Inverted transparency model support along with a new constraint to identify inverted nets.
• Ability to associate multiple BSDL files to a single JTAG device.
• FlexNet network licensing for ScanExpress JET.
• NAND Flash bad block management support in ScanExpress JET.
• JET support for Freescale i.MX35 and Texas Instruments AM18x processors.
• MSP430F5xxx programming support.
• Optimization of STAPL file execution for improved throughput.

Current Corelis customers that have a valid maintenance contract can now access the new version 7.7 CD through the Corelis support website. To inquire about a maintenance package or to obtain a full list of improvements, please contact the Corelis sales team at (562) 926-6727; or send an email to sales@corelis.com.

As always, Corelis offers free training to all clients so that they may immediately utilize the various new product features and innovations now available. Class schedules and registration information can be found on the Corelis website at:

http://www.corelis.com/education/JTAG_Boundary-Scan_Seminars_and_Training.htm

About Corelis
Corelis, Inc., a subsidiary of Electronic Warfare Associates, Inc., offers bus analysis tools, embedded test tools, and the industry’s broadest line of JTAG/boundary-scan software and hardware products combining exceptional ease-of-use with advanced technical innovation and unmatched customer service. Since its founding in 1991, Corelis has delivered a diverse range of electronic test equipment solutions for customers across a wide range of industries, including aerospace, defense, medical, manufacturing, networking, and telecommunications. Today, Corelis continues that trend with focus on product ease of use and dedication to customer service.

Source: Corelis Releases New CD Version 7.7 Boundary-Scan Tool Suite

Teradyne and Corelis Announce Agreement to Bolster Boundary-Scan In-Circuit Test Capability

NORTH READING, Mass. – May 10, 2012 – Teradyne, Inc. (NYSE:TER) announced that it has entered into an OEM agreement with Corelis, Inc. to sell and distribute a package of Corelis ScanExpress boundary-scan test execution and diagnostic software and hardware modules. The solution establishes a straightforward integration path for adding advanced boundary-scan and embedded test capabilities to Teradyne's popular TestStation™ legacy GR228X family of In-Circuit Test systems.

The solution includes the Corelis USB-1149.1 or QuadTAP hardware Custom Function Modules which incorporate both the boundary-scan controller and TAP hardware directly on Teradyne's Multi-Function Application Board. Once installed in the system, the JTAG, GPIO, I²C, and SPI signals are available to test fixtures and the tester backplane; no external Corelis hardware is necessary in the test fixture or in the PC controller. The QuadTAP/CFM configuration option provides access to up to four independent Test Access Ports (TAPs).

“Corelis product integration adds advanced boundary-scan capabilities to Teradyne systems such as 100 MHz high-speed clock rates, testability of IEEE-1149.6 AC-coupled digital networks and full in-system programming capabilities for Flash and CPLD devices,” says Ryan Jones, Senior Technical Marketing engineer, Corelis. “This OEM agreement not only provides Teradyne customers direct access to these benefits, but also demonstrates Teradyne’s confidence in Corelis as a value-added solutions partner.”

“Teradyne welcomes the advanced Corelis boundary-scan solutions as an option for our in-circuit test systems,” said Bobby Griffis, marketing director for Teradyne’s Commercial Board Test Group. “Some of Teradyne’s key customers rely on Corelis boundary-scan products, and this implementation underlines Teradyne’s long-term product strategy to provide an open architecture in-circuit test platform for our customers and make it convenient for them to utilize the boundary-scan solutions which they value most.”

About Corelis
Corelis, Inc., a subsidiary of Electronic Warfare Associates, Inc., offers bus analysis tools, embedded test tools, and the industry’s broadest line of JTAG/boundary-scan software and hardware products combining exceptional ease-of-use with advanced technical innovation and unmatched customer service. Since its founding in 1991, Corelis has delivered a diverse range of electronic test equipment solutions for customers across a wide range of industries, including aerospace, defense, medical, manufacturing, networking, and telecommunications. Today, Corelis continues that trend with focus on product ease-of-use and dedication to customer service. ScanExpress, USB-1149.1/CFM, and QuadTAP/CFM are trademarks of Corelis, Inc.

About Teradyne
Teradyne (NYSE:TER) is a leading supplier of Automatic Test Equipment used to test semiconductors, wireless products, data storage and complex electronic systems which serve consumer, communications, industrial and government customers. In 2011, Teradyne had sales of $1.4 billion and employs approximately 3,300 people worldwide. For more information, visit www.teradyne.com. Teradyne® is a registered trademark of Teradyne, Inc. in the U.S. and other countries. All product names are trademarks of Teradyne, Inc. (including its subsidiaries) or their respective owners.

Source: Teradyne and Corelis Announce Agreement to Bolster Boundary-Scan In-Circuit Test Capability

Corelis Announces Multi-TAP JTAG Solution for Teradyne ICTs

Independent, Four-channel Support for Complete Control with Advanced JTAG Configurations.

Go to Product Page

Cerritos, CA, April 3, 2012 – Following the recent USB-1149.1/CFM announcement showcasing a high-performance single-channel JTAG hardware platform for Teradyne ICTs, Corelis, Inc. announced today the QuadTAP/CFM, a four-channel JTAG hardware platform that seamlessly integrates advanced boundary-scan test capabilities into Teradyne in-circuit testers. The QuadTAP/CFM is designed specifically for use with Teradyne TestStation™ and GR228x series testers. The QuadTAP/CFM provides Teradyne users the benefit of:

• Advanced JTAG control using vacant slots on a Teradyne Custom Function Board (CFB)

• Configuration versatility—allowing up to two Test Access Ports (TAPs) with a single CFM slot or up to four TAPs using expander modules.

• Independently adjustable TAP interface voltages from 1.25V to 3.3V

• High-speed 100 MHz test clock rate for boundary-scan test support

• Compatibility with advanced IEEE-1149.6 AC-coupled digital networks

• In-system programming of Flash and CPLD devices including direct SPI and I2C support

The QuadTAP/CFM is a single slot Custom Functional Module (CFM) form factor board that installs directly into one of four slots on a Teradyne Custom Function Board (CFB). Integration is simple and transparent; once installed in the system, up to eight signals of the QuadTAP/CFM JTAG, GPIO, I²C, and SPI are available to test fixtures and the tester backplane. Additional signals are made available using the included Expander modules which install into additional CFB slots. Integrated SPI and I²C programming features make the QuadTAP/CFM an ideal and universal solution for boundary-scan, JTAG embedded test, and in-system programming applications.

“The QuadTAP/CFM offers a completely seamless and versatile hardware solution to meet multi-TAP JTAG testing requirements on existing Teradyne equipment,” says Ryan Jones, Senior Technical Marketing Engineer at Corelis. “Its flexible configuration is designed to handle a wide variety of JTAG signal layouts. Combining the QuadTAP/CFM with Corelis ScanExpress software provides the most complete JTAG test solution in the industry.”

About Corelis
Corelis, Inc., a subsidiary of Electronic Warfare Associates, Inc., offers bus analysis tools, embedded test tools, and the industry’s broadest line of JTAG/boundary-scan software and hardware products combining exceptional ease-of-use with advanced technical innovation and unmatched customer service. Since its founding in 1991, Corelis has delivered a diverse range of electronic test equipment solutions for customers across a wide range of industries, including aerospace, defense, medical, manufacturing, networking, and telecommunications. Today, Corelis continues that trend with focus on product ease of use and dedication to customer service.

Source: Corelis Announces Multi-TAP JTAG Solution for Teradyne ICTs

Corelis Adds JET Support for TI Sitara ARM Microprocessors

Non-intrusive functional test solution for high performance ARM microprocessors

Jump to processor support page: TI AM18x AM DM37x

Cerritos, CA, December 6, 2011 – Corelis, Inc., the leading supplier of high-performance JTAG test and measurement tools, announced today ScanExpress JET™ support for Texas Instruments Sitara™ ARM® Cortex™-A8 and ARM9™ microprocessors, specifically the AM37x, DM37x, and AM18x families. ScanExpress JTAG Embedded Test (JET) is a cutting edge test methodology providing at-speed testing of embedded processor-based electronic printed circuit boards and systems to detect, isolate, and diagnose structural and functional defects while minimizing test development time and resource investment.

ScanExpress JET utilizes a processor’s JTAG debug port to download and command execution of microprocessor coded test steps which enable at-speed functional testing of the processor and all major peripheral interfaces. ScanExpress JET also provides an integrated development environment allowing users to create or import their own scripted test cases through a simplified graphical user interface. Benefits of using ScanExpress JET for TI Sitara ARM microprocessors include:

• Standardized interface tests for SDRAM memory, I2C, Ethernet, PMIC, and UART
• Fast in-system programming and testing of parallel and serial NOR and NAND Flash
• Automatic test development for supported peripherals
• Integrated scripting environment for test customization
• No boot code requirement for test execution

"The IEEE-1149.1 JTAG standard has quietly evolved to close the test coverage gaps created by technology miniaturization and high-speed interfaces," states Ryan Jones, Senior Technical Marketing Engineer at Corelis. "Processor driven test solutions, such as ScanExpress JET, are able to remove the necessity of having a large number of JTAG devices on a board to justify JTAG testing—a single MPU is often adequate. Applications for Texas Instruments Sitara ARM microprocessors represent the typical high performance, low accessibility case where they are the only JTAG device in a design making them great candidates to apply this technology."

Sitara microprocessors are utilized in applications such as retail point-of-sale terminals, industrial automation, human machine interfaces, single-board computing, network storage, and network printing. ScanExpress JET for TI Sitara ARM microprocessors is designed to provide engineers with a ready-to-use solution that helps speed up their design, development, and test processes. To receive additional education on the benefits of embedded testing, download the ScanExpress JET whitepaper today at:

http://www.corelis.com/whitepapers/ScanExpress_JET_Whitepaper.pdf.

About Corelis
Corelis, Inc., a subsidiary of Electronic Warfare Associates, Inc., offers bus analysis tools, embedded test tools, and the industry’s broadest line of JTAG/boundary-scan software and hardware products combining exceptional ease-of-use with advanced technical innovation and unmatched customer service. Since its founding in 1991, Corelis has delivered a diverse range of electronic test equipment solutions for customers across a wide range of industries, including aerospace, defense, medical, manufacturing, networking, and telecommunications. Today, Corelis continues that trend with focus on product ease of use and dedication to customer service.

Source: Corelis Adds JET Support for TI Sitara ARM Microprocessors

Corelis Extends JTAG Embedded Testing to Freescale i.MX51

JTAG functional test solution for i.MX51 applications processors increases test coverage

Jump to processor support page

Cerritos, CA, November 15, 2011 – Corelis, Inc., the leading supplier of high-performance JTAG test and measurement tools, announced today ScanExpress JET™ support for all members of the Freescale i.MX51 family of applications processors. ScanExpress JTAG Embedded Test (JET) provides at-speed testing of embedded processor-based electronic printed circuit boards and systems to detect, isolate, and diagnose structural and functional defects with minimal development and investment.

ScanExpress JET controls the i.MX51’s ARM Cortex™-A8 core through the JTAG debug port, enabling development and execution of binary and script test steps using a graphical user interface on the host PC. Benefits of using ScanExpress JET for i.MX51 applications processors include:

• Standardized interface tests for SDRAM memory, I2C, Ethernet, PMIC, and UART

• Fast in-system programming and testing of parallel and serial NOR and NAND Flash

• Fully automatic test development for all supported peripherals

• Integrated scripting environment for test customization

• No boot code requirement for test execution

Freescale i.MX51 applications processors offer low power, efficient multimedia processing and are targeted at consumer, industrial, automotive, and general embedded applications, representing an ideal platform for ScanExpress JET. “Systems built around the i.MX51 are often designed to fit a particular form factor and need to be highly reliable,” explains Ryan Jones, Senior Technical Marketing Engineer at Corelis. “These constraints contribute to the need for automated non-intrusive, at-speed functional tests. ScanExpress JET offers significant functional test coverage with minimal impact on the system design—a simple JTAG connection offers complete control over the CPU allowing convenient and reusable tests for development and production.”

To receive additional education on the benefits of embedded testing, download the ScanExpress JET whitepaper today at:

http://www.corelis.com/whitepapers/ScanExpressJET_Whitepaper.htm

About Corelis
Corelis, Inc., a subsidiary of Electronic Warfare Associates, Inc., offers bus analysis tools, embedded test tools, and the industry’s broadest line of JTAG/boundary-scan software and hardware products combining exceptional ease-of-use with advanced technical innovation and unmatched customer service. Since its founding in 1991, Corelis has delivered a diverse range of electronic test equipment solutions for customers across a wide range of industries, including aerospace, defense, medical, manufacturing, networking, and telecommunications. Today, Corelis continues that trend with focus on product ease of use and dedication to customer service.

Source: Corelis Extends JTAG Embedded Testing to Freescale i.MX51

Corelis Announces JTAG Embedded Testing for AMD Processors

Complete functional test solution for Athlon, Turion, and Opteron product families.

Jump to processor support page
Cerritos, CA, October 17, 2011 – Corelis, Inc., the leading supplier of high-performance JTAG test and measurement tools, announced today ScanExpress JET support for AMD embedded processors. Supported AMD processor families include Turion™ II Neo, Athlon™ II Neo, Opteron™ 4100, and Opteron™ Quad-Core (socket Fr5). These processors represent high-performance, low power processing for edge-of-enterprise markets including storage and telecommunications, as well as more traditional embedded markets such as security and medical imaging, military systems, and single-board computing.

ScanExpress JET is the industry’s preferred solution for automated at-speed, non-intrusive functional testing. With ScanExpress JET, JTAG supported CPUs provide the centerpiece for printed circuit board testability, enabling an extension of test coverage typically not available through other methods. The major benefits of using ScanExpress JET for AMD embedded processors include:

• Standardized tests for SDRAM memory, SPI Flash, I2C, and UART
• HyperTransport™ link validation
• Peripheral detection on PCI & PCIe buses
• Fully automatic test development for all supported peripherals
• No boot code requirement for test execution

“Requirements for embedded test techniques continue to grow due to increasing signal speeds and lack of test point access, exceeding the capabilities of traditional bed-of-nails test methods,” cites Ryan Jones, Senior Technical Marketing Engineer at Corelis. “ScanExpress JET now delivers a commercially off-the-shelf embedded test solution specifically targeted towards designers, developers, and production test personnel employing leading-edge AMD technology.”

To receive additional education on the benefits of embedded testing, download the ScanExpress JET whitepaper today at:
http://www.corelis.com/whitepapers/ScanExpressJET_Whitepaper.htm.

About Corelis
Corelis, Inc., a subsidiary of Electronic Warfare Associates, Inc., offers bus analysis tools, embedded test tools, and the industry’s broadest line of JTAG/boundary-scan software and hardware products combining exceptional ease-of-use with advanced technical innovation and unmatched customer service. Since its founding in 1991, Corelis has delivered a diverse range of electronic test equipment solutions for customers across a wide range of industries, including aerospace, defense, medical, manufacturing, networking, and telecommunications. Today, Corelis continues that trend with focus on product ease of use and dedication to customer service.

Source: Corelis Announces JTAG Embedded Testing for AMD Processors

Corelis Offers Advanced JTAG Solution for Teradyne ICTs

New Hardware Platform Features IEEE-1149.6 AC-coupled testing, automatic vector generation, and In-System Programming.
Cerritos, CA, October 4, 2011 – Corelis, Inc., the leading supplier of high-performance JTAG test and measurement tools, announced today the USB-1149.1/CFM, a JTAG hardware platform that seamlessly integrates advanced boundary-scan test patterns into Teradyne in-circuit testers. The USB-1149.1/CFM is designed specifically for use with Teradyne TestStation and GR228x series testers. By utilizing the USB-1149.1/CFM with Corelis’ ScanExpress family of JTAG software products, Teradyne users gain the benefit of:

• High-speed 100 MHz clock rate boundary-scan test support
• JTAG test vector reusability across multiple manufacturing test stations
• Testing of IEEE-1149.6 AC-coupled digital networks
• In-system programming of Flash and CPLD devices including direct SPI and I²C support
• Fully automated boundary-scan test vector generation and execution
• A powerful script engine to customize boundary-scan tests

The USB-1149.1/CFM is a single slot Custom Functional Module (CFM) form factor board that installs directly into one of four slots on a Teradyne Custom Function Board (CFB). Integration is simple and transparent; once installed in the system, the USB-1149.1/CFM JTAG, GPIO, I2C, and SPI signals are available to test fixtures and the tester backplane. Integrated SPI and I2C programming features make the USB-1149.1/CFM an ideal and universal solution for combined boundary-scan, JTAG embedded test, and in-system programming applications.

Harrison Miles, Director of Business Development at Corelis, states, “Requirements for boundary-scan solutions will continue to grow as a result of increasing PCB complexities and technology miniaturization. Adding boundary-scan to in-circuit testers represents a logical step for increasing system capability as high-speed buses and accessibility issues continue to become more prevalent.”

“The USB-1149.1/CFM is designed specifically to ease boundary-scan deployment with existing Teradyne equipment,” adds Ryan Jones, Senior Technical Marketing Engineer at Corelis. “Our solution delivers increased test coverage, faster test times, and lower overall costs, allowing customers to maintain a notable ROI on their Teradyne systems.”

About Corelis
Corelis, Inc., a subsidiary of Electronic Warfare Associates, Inc., offers bus analysis tools, embedded test tools, and the industry’s broadest line of JTAG/boundary-scan software and hardware products combining exceptional ease-of-use with advanced technical innovation and unmatched customer service. Since its founding in 1991, Corelis has delivered a diverse range of electronic test equipment solutions for customers across a wide range of industries, including aerospace, defense, medical, manufacturing, networking, and telecommunications. Today, Corelis continues that trend with focus on product ease of use and dedication to customer service.

Source: Corelis Offers Advanced JTAG Solution for Teradyne ICTs